Tag：StdPbc-0819

C07900 - SEMI C79 - Guide to Evaluate the Efficacy of Sub-15 nm Filters Used in Ultrapure Water (UPW) Distribution Systems

C07900 - SEMI C79 - Guide to Evaluate the Efficacy of Sub-15 nm Filters Used in Ultrapure Water (UPW) Distribution Systems

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C08200 - SEMI C82 - Test Method for Particle Removal Performance of Liquid Filter Rated 20 to 50 nm With Liquid-Borne Particle Counter

C08200 - SEMI C82 - Test Method for Particle Removal Performance of Liquid Filter Rated 20 to 50 nm With Liquid-Borne Particle Counter

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D06700 - SEMI D67 - Test Method for Antifouling Property and Chemical Resistance of FPD Polarizing Films and Its Materials

D06700 - SEMI D67 - Test Method for Antifouling Property and Chemical Resistance of FPD Polarizing Films and Its Materials

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E15400 - SEMI E154 - Specification for Mechanical Features of 450 mm Load Port

E15400 - SEMI E154 - Specification for Mechanical Features of 450 mm Load Port

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E15800 - SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling

E15800 - SEMI E158 - Specification for Mechanical Features of Fab Wafer Carrier Used to Transport and Store 450 mm Wafers (450 FOUP) and Kinematic Coupling

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E15900 - SEMI E159 - Specification for Mechanical Features of Multi Application Carrier (MAC) Used to Transport and Ship 450 mm Wafers

E15900 - SEMI E159 - Specification for Mechanical Features of Multi Application Carrier (MAC) Used to Transport and Ship 450 mm Wafers

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E17400 - SEMI E174 - Specification for Wafer Job Management (WJM)

E17400 - SEMI E174 - Specification for Wafer Job Management (WJM)

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S01300 - SEMI S13 - Environmental, Health and Safety Guideline for Documents Provided to the Equipment User for Use With Manufacturing Equipment

S01300 - SEMI S13 - Environmental, Health and Safety Guideline for Documents Provided to the Equipment User for Use With Manufacturing Equipment

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MS00200 - SEMI MS2 - Test Method for Step Height Measurements of Thin Films

MS00200 - SEMI MS2 - Test Method for Step Height Measurements of Thin Films

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MS00500 - SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures

MS00500 - SEMI MS5 - Test Method for Wafer Bond Strength Measurements Using Micro-Chevron Test Structures

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